Parul Patel1, Arvind Rajawat1 and Pooja Jain2, 1Maulana Azad National Institute of Technology Bhopal, India, 2Automotive and Discrete group STMicroelectronics Private Limited Greater Noida, India
With advancement in technology, the feature size of transistors is shrinking and the transistor count in a circuit design is exponentially increasing. As a result, it is hard to control and observe internal nodes leading to complexity in locating and debugging faults specially for sequential circuits. Design for Testability (DFT) provides a way for fault detection of the circuit under test in less simulation duration with little increase in area. Many techniques are proposed under DFT for pattern simulation. In this paper, we have compared two such pattern simulation techniques namely scan compression and internal scan. The experiment is performed on different benchmark circuits, it is observed the simulation time is significantly reduced with increased coverage and a little area overhead.
DFT, Scan Compression, Internal Scan